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Scratch Step DIWafer Polyurethane AAO IcelandSpar PtfeFilter kelvin probe force microscopy phase_change SrTiO3 FAFailureAnlaysis dielectric trench UnivMaryland ScanningSpreadingResistanceMicroscopy HiVacuum Phosphide ReflexLens TemperatureControl Mechinical Imprint Hole AEAPDES Bmp 2-vinylpyridine single_layer LFM VerticalPFM 3-hexylthiophene SKKU HDD Vortex MembraneFilter Modulus LeakageCurrent MBE
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Block copolymer thin film
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm, 1μm×1μm
- Scan Rate: 0.5Hz, 1Hz
- Pixel: 512×512, 512×512
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm, 1μm×1μm
- Scan Rate: 0.5Hz, 1Hz
- Pixel: 512×512, 512×512