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Annealing NeodymiumMagnets Tapping SolarCell AnodizedAluminumOxide Memory Semiconductor Pinpoint PFM Optical FAFailureAnlaysis ContactModeDots Liquid HighAspect epitaxy dielectric_trench MfmAmplitude StrontiumTitanate ConductingPolymer sputter Praseodymium CompactDisk Annealed molecular_beam OpticalModulator Non-ContactMode fe_nd_b PUR suspended_graphene Varistor Jason LDPE Vortex Roughness FloppyDisk PFM
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Block copolymer phase change by temp
Scanning Conditions
- System: NX10
- Scan Mode: Tapping,TCS2
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×256
- Scan Mode: Tapping,TCS2
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×256