-
FrequencyModulation nanobar TemperatureControlledAFM Temasek_Lab Melt TPU KAIST Ca10(PO4)6(OH)2 LiNbO3 ThermalProperties Lattice Memory Chloroform PUR Ptfe C60H122 Boron Pattern Mapping Materials BismuthVanadate Imprint Vortex silicon_oxide Phosphide Spain AIN polymeric_arrays Litho HanyangUniv DLaTGS WS2 TemperatureControl Temperature Polystyrene
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, Failure analysis
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 11μm×11μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Sample bias: -0.5V