-
LowDensityPolyethylene oxide_layer KevlarFiber ThinFilm EFM margarine PhaseTransition Mosfet Layer GranadaUniv temp_control PVAC Solution PtfeFilter ito_film Optical ThermalProperties single_layer IIT-chennai Foil Pattern Crystal Cross-section GalliumPhosphide Holes DeflectionOptics PrCurve TiO2 Tin sulfide ScanningSpreadingResistanceMicroscopy SingleCrystal Subhajjit FrictionForce C36H74 SKPM
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, Failure analysis
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 11μm×11μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Sample bias: -0.5V