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Metal Molybdenum HardDisk C_AFM lift_mode PDMS ForceMapping Polydimethylsiloxane Austenite EFM Optic Grain HafniumDioxide Sic SingleLayer TappingMode WS2 Hafnia Patterns fe_nd_b LateralPFM light_emission BlockCopolymer PolymerPatterns Barium_titanate HighAcpectRatio Dimethicone Annealed FrequencyModulation Self-assembledMonolayer MultiLayerCeramicCapacitor Vinylpyridine EvatecAG Vortex hetero_structure
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CMP test key
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 1Hz for 100μm2 / 1.5Hz for 30μm2
- Scan Size : 100μm2, 30μm2
- Pixel Size : All 1024×512
- Cantilever : CMCL-AC240TS (k=2N/m, f=70kHz)