-
DeoxyribonucleicAcid OxideLayer ForceVolumeImage Electronics SetpointMode blended polymers MonoLayer temperature controller AFM HDD Annealed LowDensityPolyethylene dichalcogenide Metal NtuEee ReflexLens PinPointMode HfO2 Inorganic Wildtype Laser IRDetector Water FrictionForce Adhesion Metal-organicComplex CeNSE_IISc Polypropylene Ucl TungstenDeposition Nanofiber Growth ScratchMode Croatia FM-KPFM Battery
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on Si substrate
Scanning Conditions
- System: NX10
- Scan Mode: Lithography
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 1024×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black -10V, White 0V