-
FrictionalForceMicroscopy LiIonBattery align temperature controller AFM Hexacontane CP-AFM HexagonalBN Granada biocompatible nanobar MESA structure Phthalocyanine GaN Corrosion HumanHair Gallium VortexCore ThinFilm SiliconCrystal Vac Holes Mechinical Optical Moire Alloy temperature_control Display TCS HighAcpectRatio Polyaniline HOPG AtomicSteps PrCurve tip_bias_mode NtuEee
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on Si substrate
Scanning Conditions
- System: NX10
- Scan Mode: Lithography
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 1024×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black -10V, White 0V