-
LiquidCrystal SiWafer Hydroxyapatite SiliconCrystal China ContactModeDots UTEM Copper ChemicalCompound Domain LDPE Oxidation TungstenDeposition Device Cell SRAM strontiu_titanate Magnets Phthalocyanine Scanning_Thermal_Microscopy Organic hetero_structure DIWafer Electrode Ram FuelCell HexagonalBN LateralForceMicroscopy Sio2 frequency_modulation CompactDisk C60H122 MonoLayer Indent Sapphire
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
NiFe
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm