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high_resolution C_AFM Polyvinylidene ElectroChemical StrontiumTitanate CalciumHydroxyapatite LFM SKPM ContactMode Heat Fet MLCC Led Tungsten_disulfide Lateral block_copolymer fe_nd_b IVSpectroscopy Pores Current LateralForce 3-hexylthiophene TriGlycineSulphate Logo PFM Holes AIN Croatia OpticalModulator PtfeMembrane SingleCrystal Wonseok light_emission Hexylthiophene MfmPhase
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Polycrystalline ferroelectric BCZT
Scanning Conditions
- System: NX12
- Scan Mode: PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.4Hz
- Pixel: 256×256
- Sample bias sweep range for Piezoresponse curve: -10V ~ +10V