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Nanopattern LogAmplifier LateralForceMicroscopy OpticalModulator BiVO4 Self-assembledMonolayer LiftMode Growth Metal Device Global_Comm Insulator Reduction Cross-section BlockCopolymer Ananth Tin disulfide light_emission PyroelectricDetector fluoroaalkane OpticalElement TCS ItoGlass mono_layer LaAlO3 ImideMonomer Current self-assembled_monolayer Ecoli Heat TipBiasMode Adhesion Phenanthrene Plug Conductive AFM
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Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126