-
MolecularSelfAssembly Chemical_Vapor_Deposition Vortex self-assembly kelvin probe force microscopy Conduct Ucl CrAu ShenYang BiFeO3 cross section PS_PVAC ThermalConductivity Aggregated_molecules Multiferroic_materials AM-KPFM ConductingPolymer Annealed Layer thermal_property FastScan MagneticForce Wildtype temp Perovskite Neodymium FAFailureAnlaysis ChemicalCompound epitaxy Chungnam_National_University small_scan FrictionalForce Fendb MolybdenumDisulfide Polymer
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Atomic steps on GaP(Gallium Phosphide) layer on Si
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: PPP-NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512