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Annealed MechanicalProperty self-assembly Hexacontane bias_mode Composite FAFailureAnlaysis Molybdenum_disulfide Foil Change ScanningIon-ConductanceMicroscopy InorganicCompound Optoelectronic Lattice CeNSE_IISc SmalScan AM_SKPM Litho Fiber ScanningKelvinProbeMicroscopy PhaseImaging Oxide HDD Polytetrafluoroethylene molecule DeflectionOptics semifluorinated_alkane HafniumDioxide OpticalWaveguides kelvin probe force microscopy Annealing Implant Butterfly piezoelectric force microscopy Phosphide
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Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256