-
Mechanical CastIron Magnetic Force Microscopy LaAlO3 Carbon Biology oxide_layer LiftMode Polymer temp NCM Sio2 Resistance StainlessSteel Memory Floppy LateralForce #EC Hair SRAM PetruPoni_Institute silicon_carbide Battery Gong ScanningIon-ConductanceMicroscopy Hexatriacontane NUS_Physics MfmAmplitude Yttria_stabilized_Zirconia ChemicalCompound Friction LateralPFM DNA optoelectronics NeodymiumMagnets
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256