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self-assembled_monolayer LiNbO3 Boundary Hysteresys InorganicCompound LateralPFM plastics Organic SmalScan NUSNNI Nanopattern GaAs Bio thermoplastic_elastomers TappingMode 2dMaterials PinpointPFM STO TemperatureControllerAFM MagneticForceMicroscopy Magnetic food MembraneFilter Chungnam_National_University Perovskite FM_SKPM Hafnia organic_polymer Conduct SetpointMode PUR HighAcpectRatio Silicon MonoLayer Lattice
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V