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EFM Pores 3-hexylthiophene light_emission Inorganic Austenite HiVacuum China Ni-FeAlloy LiftHeight GlassTemp 2-vinylpyridine Array Chungnam_National_University ScratchMode kelvin probe force microscopy Vinylpyridine Heat MBE Conduct MolecularSelfAssembly SurfaceOxidation Materials HDD WPlug HfO2 Polyurethane Cobalt-dopedIronOxide MeltingPoint Defects FM_SKPM Sic LiIonBattery Ceramic atomic_steps
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CMP test key
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 1Hz for 100μm2 / 1.5Hz for 30μm2
- Scan Size : 100μm2, 30μm2
- Pixel Size : All 1024×512
- Cantilever : CMCL-AC240TS (k=2N/m, f=70kHz)