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Boron Chromium Fiber ItoGlass Composition SmalScan MagneticArray tip_bias_mode Defects Mosfet MechanicalProperty MESA structure epitaxy FrictionForce PS_LDPE HanyangUniv Defect CalciumHydroxide Silver Al2O3 TempControl LaAlO3 Polyimide Layer Ecoli BiasMode OpticalModulator TemperatureControllerStage mono_layer Epoxy SiliconCrystal Wonseok HfO2 Wildtype PrCurve
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Suspended silicon nitride membrance
Scanning Conditions
- System : NX20
- Scan Mode: Tapping
- Scan Rate : 0.2 Hz
- Scan Size : 75μm×75μm
- Pixel Size : 256×256
- Cantilever : TESPA-V2 (k=37N/m, f=320kHz)