-
Zagreb Dr.JurekSadowski Temperature temp_control Polyvinylidene Tapping OpticalElement ScanningIon-ConductanceMicroscopy Floppy AtomicSteps Jason Styrene TappingMode SICM PhaseImaging TemperatureControllerStage Chloroform Potential PS_LDPE University_of_Regensburg ThermalProperties Reduction Wafer LightEmiting cannabinoid Insulator FastScan fluoroaalkane RedBloodCell BiFeO3 light_emission PatternedSapphireSubstrat Vortex SelfAssembly Edwin
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126