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SiWafer HumanHair Phthalocyanine SurfaceOxidation Metal layers PANI suspended_graphene ChemicalCompound CHRYSALIS_INC Celebration kelvin probe force microscopy TipBiasMode Pattern Calcium AtomicLayer Sidewall Hexylthiophene Solar Polyethylene ThermalProperties aluminum_nitride China FrictionForce Patterns Adhesive SmalScan PinPointMode LiftHeight OxideLayer SKPM NCM\ ReflexLens chemical_compound InorganicCompound
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Polymer patterns on Si (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256