-
SoftSample Composite HardDisk Photovoltaics Defects Friction semifluorinated_alkanes Mechanical&nanotechnology GalliumPhosphide CNT Fe_film Holes block_copolymer Mobile TungstenThinFilmDeposition Liquid IISCBangalore LateralForceMicroscopy Sio2 Etch LithiumNiobate Al2O3 cooling TungstenDeposition GlassTemp Lift Techcomp Aluminium_Oxide Hysteresys Co/Cr/Pt ferromagnetic Polyurethane Wang SiliconeOxide VortexCore
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
ITO glass
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512