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Led CarbonNanotube Korea AM_SKPM sputter Polyurethane Aggregated_molecules MfmAmplitude Pvdf LiftHeight Deposition TemperatureControllerAFM Chemical Vapor Deposition Inorganic_Compound #EC Iron Chemical_Vapor_Deposition hydrocarbon #Materials Polyethylene DeflectionOptics Polyaniline Copper Force-distance BariumTitanate lithography Change FrictionalForceMicroscopy Materials nanomechanical CuParticle Cross-section OpticalWaveguide UnivCollegeLondon LMF
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ITO glass
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512