-
Holes MagneticForce Sapphire OrganicSemiconductor Logo Multiferroic_materials layers Piranha INSPParis Chromium thermal_conductivity PrCurve Gong UTEM PolycrystallineFerroelectricBCZT FailureAnalysis Barium_titanate PtfeFilter temperature controller AFM UnivOfMaryland SurfaceOxidation Heating Mosfet ContactModeDot Polypropylene SurfaceChange IISCBangalore SiliconCrystal gallium_nitride HumanHair SFAs Mechanical Croatia Jason Device
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
MoS2 Layers on SiO2
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256