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MembraneFilter Defect LateralForceMicroscopy Tungsten_disulfide MESA structure IVSpectroscopy thermal_property ScanningSpreadingResistanceMicroscopy norganic Optoelectronic F14H20 Lateral_Force_Microscopy MoS2 suspended_graphene UTEM domain_switching Magnetic Force Microscopy piezoelectric force microscopy ScratchMode HfO2 temperature_control Ananth HBN FrictionalForce ULCA LeakageCurrent UnivOfMaryland PolyimideFilm Treatment EPFL HexacontaneFilm Pore Ram Conductive AFM MagneticForceMicroscopy
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MembraneFilter Defect LateralForceMicroscopy Tungsten_disulfide MESA structure IVSpectroscopy thermal_property ScanningSpreadingResistanceMicroscopy norganic Optoelectronic F14H20 Lateral_Force_Microscopy MoS2 suspended_graphene UTEM domain_switching Magnetic Force Microscopy piezoelectric force microscopy ScratchMode HfO2 temperature_control Ananth HBN FrictionalForce ULCA LeakageCurrent UnivOfMaryland PolyimideFilm Treatment EPFL HexacontaneFilm Pore Ram Conductive AFM MagneticForceMicroscopy