-
OpticalModulator Heating INSPParis CrossSection Optoelectronic SiWafer Biology HexagonalBN Ceramic Silicon CP-AFM CrAu oxide_layer Growing Resistance Sphere Floppy HexacontaneFilm SPMLabs molecules Perovskite Silver SurfaceOxidation Polyimide Neodymium Organic BlockCopolymer HOPG KelvinProbeForceMicroscopy PS_PVAC HardDisk Electical&Electronics PyroelectricDetector IVSpectroscopy Tin disulfide
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256