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thermal_property Non-ContactMode CarbonNanotube Change 2-vinylpyridine SurfaceOxidation Glass mechanical property Chloroform Ram Semiconductor Composition Electrical&Electronics amplitude_modulation Alloy Ptfe AAO Gallium BismuthVanadate Hexacontane dichalcogenide Current Mosfet Resistance Zagreb Zhi OxideLayer C_AFM SoftSample Strontium Leakage ElectroChemical Holes PtfeMembrane RedBloodCell
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Strainded MoS₂ on Si
Scanning Conditions
- System : FX40
- Scan Mode: Sideband KPFM
- Scan Rate : 0.15Hz
- Scan Size : 50μm×13μm
- Pixel Size : 2048×1024
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)