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Gallium Mechanical Current NCM Etch CuParticle Workfunction SRAM DeflectionOptics Tungsten SiWafer LightEmission strontiu_titanate Floppy GlassTemperature plastic MagneticPhase nanomechanical TungstenDeposition CeramicCapacitor CVD Alloy ConductingPolymer Magnetic Force Microscopy Wildtype tip_bias_mode OpticalWaveguides Au111 BiVO4 Layer FrictionalForce Co/Cr/Pt Granada Hafnium_dioxide ChemicalCompound
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Galfenol (Alloy of iron and gallium)
Scanning Conditions
- System: XE15
- Scan Mode: MFM
- Cantilever: MFMR (k=2.8N/m, f=70kHz)
- Scan Size: 40μm×40μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- MFM Lift height: 50nm