-
Polytetrafluoroethylene Battery PolyvinylideneFluoride Optical SFAs Phosphide dielectric trench Ecoli IRDetector Lift Silver BariumTitanate graphene_hybrid silicon_carbide Ram SAM Neodymium FM-KPFM Pattern biocompatible BoronNitride MBE PDMS LogAmplifier Optic Gong Adhesive SSRM Oxide KevlarFiber BismuthFerrite Nanopattern 2dMaterials Defects Patterns
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Domain switching on PZT
Scanning Conditions
- System: NX10
- Scan Mode: Lithography, PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black +10V, White -10V