-
Moire ForceVolumeMapping Indium_tin_oxide Adhesive epitaxy Electrical&Electronics Dental thermal_conductivity Phosphide Wang Chrome non_contact Friction Polyaniline temperature controller AFM MolybdenumDisulfide Hexatriacontane Litho Graphene TemperatureControllerAFM PolyStylene InLiquid ring shape Steps CeNSE_IISc MechanicalProperties Metal Treatment CeramicCapacitor multi_layer UnivMaryland ElectroChemical Sadowski FM_KPFM Crystal
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Co/Cr/Pt
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm