AFMの表面処理への応用
今回は、表面処理技術に対する評価手法の一つとして、AFMの応用を紹介したい。 パーク・システムズ・ジャパン アプリケーション エンジニア 後...
原子間力顕微鏡 (AFM) を用いた表面改質層の評価事例
本稿では、こうした様々な特徴を持つパーク・システムズ社のAFMを用いた、表面改質・薄膜関連の評価事例の一端を紹介する。 原子間力顕微鏡 (A...
原子間力顕微鏡ナノリソグラフィーによるナノスケール材料のパターニング
ナノテクノロジーは，エレクトロニクスからバイオメディカル技術まで，さまざまな分野で応用されており，科学界でも注目を集めています[1]。こ...
Nano-pipette based scanning probe microscopy
Introduction Since atomic force microscopy (AFM) has been developed1, various applications of nanotechnology were established that led to technological advances in many fields of science. Using decou...
Capturing conductive ferroelectric domain walls
Ilka Hermes and Andrea Cerreta1 1 Park Systems Europe, Germany Introduction: Ferroelectric materials typically feature wide band gaps and are therefore classified as insulators. They carry a sp...
Characterization of roughness and mechanical properties of a contact lens surface using atomic force microscopy (AFM) wi...
Research Application Technology Center Abstract A soft contact lens is mostly used type of contact lens which is made of gel-type material. This slippery and transparent material with a unique curva...
Correlating the electrochemical response of 2D materials to their thickness
Marc Brunet Cabréa, Aislan Esmeraldo Paivaa, Matej Velickýb, c, d, Paula E. Colavitaa, Kim McKelveya, e a Trinity College Dublin (Ireland) b University of Manchester (United Kingdom) c Cornell ...
Surface potential measurements of 2D materials in high vacuum
J. Serron, A.Minj, L. Wouters, T. Hantschel IMEC, Leuven, Belgium Introduction: With the scaling of conventional field effect transistors (FETs), it becomes increasingly important to ov...
MFM on Mn1.4PtSn: Investigating magnetic hosts for Anti-Skyrmions
B. E. Zuniga Cespedes1,2, A. S. Sukhanov1,3, P. Milde1, L. M. Eng1,4, I. Hermes5, A. Klasen5 1 Institute of Applied Physics, Technische Universität Dresden, D-01062 Dresden, Germany 2 Max Planck In...
Quantitative frictional properties measurement using atomic force microscopy
Research Application Technology Center, Park Systems Corp. Introduction Atomic force microscopy (AFM) is a powerful tool that can be used to obtain information on surface morphology of t...
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