INTRODUCTION Scanning Kelvin probe microscopy, or SKPM, was introduced as a tool to measure the local contact potential difference between a conducting atomic force microscopy (AFM) tip and the sampl...

Conductive AFM (C-AFM) is uniquely suited to perform electrical measurements such as current distribution with nanoscale precision and can be performed in contact mode, tapping mode, or PinPoint™ mo...

Wenqing Shi, Gerald Pascual, Byong Kim, and Keibock Lee Park Systems, 3040 Olcott Street, Santa Clara, CA 95054 ABSTRACT Nanoscale frictional measurement, or nanotribology, is an effective approach ...

Hosung Seo, Dan Goo and Gordon Jung, Park Systems Corporation Romain Stomp and James Wei Zurich Instruments   Phase-locked looping is a powerful technique that allows synchronization of multipl...

Graphene has attracted researchers' attention due to its unique band gap structure, which allows it to be used in high-mobility semiconductor devices. However, realization of such a graphene-based hig...

In order to identify and understand the root cause of a problem then develop an appropriate countermeasure, it is sometimes necessary to characterize a sample in situ. Several cutting edge application...

 An AFM is an extremely versatile tool for engineers, researchers, and other professionals that need accurate imaging and characterization of specimens at the nanoscale. It allows users to measur...

Changing the Future of Nanometrology for the Semiconductor Industry   Abstract The Three-Dimensional Atomic Force Microscopy (3D AFM) by Park Systems is an innovative and cost effective means ...