Advantages of High Vacuum for Electrical Scanning Probe Microscopy
Jonathan Ludwig1,2, Marco Mascaro1,2, Umberto Celano1, Wilfried Vandervorst1,2, Kristof Paredis1 1. IMEC, Leuven, Belgium 2. Department of Physics and Astronomy, University of Leuven, Leuven, Belgiu...
Defect Recognition on Coating Layer using PinPoint Nanomechanical Mode, Atomic Force Microscopy
Moses Lee, Jake Kim and Cathy Lee Park Systems Corporation, Suwon, Korea Introduction Surface treatment is a critical component in a variety of fields and industries such as automobil...
Mechanical properties of live and fixed cells measured by atomic force microscopy and scanning ion conductance microscop...
Jake Kim, Moses Lee and Cathy Lee Park Systems Corp., Suwon, Korea Abstract During the process of cell sample preservation, cell fixation plays an essential role for a wide range of ...
Enhanced Surface Potential Detection Study using FM-KPFM
John Paul Pineda, Charles Kim,Cathy Lee, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction Scanning Kelvin probe microscopy (KPFM) is a tool used to measure work functio...
Tooth Whitening Study using PinPoint Nanomechanical Mode of Park AFM
Alvin Lee, John Paul Pineda, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction In recent years, the importance of mechanical properties measurement has become evident in...
Transforming Technology and Manufacturing in the age of 3-D Printing
“PARK ATOMIC FORCE MICROSCOPY (AFM) PLAYS AN IMPORTANT ROLE IN OUR 3-D PRINTING PROJECTS IN THE LABORATORY. THIS POWERFUL TOOL IS CAPABLE OF LOOKING AT THE SURFACE PROFILE OF 3-D PRINTED OBJECTS CRE...
PinPoint Piezoelectric Force Microscopy
Wenqing Shi, Cathy Lee, Gerald Pascual, John Paul Pineda, Byong Kim, Keibock Lee Park Systems Inc., Santa Clara, CA USA ABSTRACT Electromechanical couplingin materials is a key property that provide...
Using AFM PinPoint™ Nanomechanical Mode for Quantification of Elastic Modulus in Materials Two Orders of Magnitude Fas...
John Paul Pineda, Gerald Pascual, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction Since the invention of atomic force microscopy, AFM has had a revolutionary impact in...
Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electroche...
Conductive AFM (C-AFM) is uniquely suited to perform electrical measurements such as current distribution with nanoscale precision and can be performed in contact mode, tapping mode, or PinPoint™ mo...
Electrochemical Atomic Force Microscopy: In Situ Monitoring of Copper Electrodeposition on Gold Surface
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