High resolution imaging of single PTFE molecules on Teflon surface
Vladimir Korolkov Park Systems UK Ltd, MediCity, Nottingham, UK. Structural studies of polymers are vital, since the application of polymer materials range from micellar drug carriers to bulletproof...
Resolving the full potential
Imaging the potential of molecule aggregates via sideband KPFM Ilka M. Hermes, Andrea Cerreta Park Systems Europe GmbH, Mannheim, Germany The work function is a material characteristic property tha...
2D Moiré Superlattice Electromechanical Characterization with Piezo-response Force Microscopy
Byong Kim, John Paul Pineda, Ben Schoenek, Jiali Zhang, Armando Melgarejo, Research Technical Services, Park Systems, Inc., USA Qiong Ma, Department of Physics, Boston College, USA Ilka Herm...
My journey with the revolutionary FX40 as an intern at Park Systems: Epilogue
By Hubert H. Cho As a high school student interested in physics, I was fortunate to participate in an internship at Park Systems, which is a nanotechnology company that develops and produces ...
Making the connection. Atomic force microscopy correlates Graphene’s functional properties on the nanoscale
Ilka M. Hermes,1 Simonas Krotkus,2 Ben Conran,3 Clifford McAleese,3 Xiaochen Wang,3 Oliver Whear,3 Michael Heuken2 1 Park Systems Europe GmbH, Mannheim, Germany 2 AIXTRON SE, Herzogenrath, Germany ...
Surface Potential Imaging via Sideband Kelvin Probe Force Microscopy
Armando Melgarejo, Ben Schoenek, and Byong Kim Technical Services, Park Systems, Inc., USA Introduction From materials science to biological research, scientists have adopted Kelvin Probe F...
Nanoscale Electrochemistry Study using SECCM Option of Park Systems
Jiali Zhang and Byong Kim Park Systems Inc., Technical Services, Santa Clara, CA USA Introduction The Holy Grail in electrocatalysis and energy storage is to correlate electrochemical activity with...
A Comparative Study of Atomic Force Microscopy between AM KPFM and Sideband KPFM, Principles and Applications
Research Application Technology Center, Park Systems Corporation Introduction Since the development of Atomic Force Microscopy (AFM) [1], several measurement modes have been developed to cha...
Contact AFM Nanolithography Based on Anodic Oxidation
Armando Melgarejo, Ben Schoenek, Jiali Zhang, and Byong Kim Park Systems, Inc., Santa Clara, CA, USA Introduction The field of nanotechnology has diversified into different areas of researc...
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