-
PolyStylene Cobalt Growth PyroelectricDetector Film ThermalConductivity GaP EFMAmplitude IcelandSpar MechanicalProperty Growing SrTiO3 BiasMode plastics sputter vertical_PFM Vacuum AEAPDES 2-vinylpyridine 3-hexylthiophene Fluoride Reading phase_change Piezo Pvdf molecular_beam PpLdpe HardDisk Metal-organicComplex SmalScan Nanotechnology thermal_conductivity HfO2 SiWafer SingleCrystal
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BTO
Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac