-
mfm_amplitude TemperatureControlledAFM Plug IRDetector Piranha ScanningTunnelingMicroscopy SingleLayer BlockCopolymer SiliconCrystal Techcomp CeNSE_IISc MoS2 Bio LiquidCrystal AdhesionEnergy Vacuum Polydimethylsiloxane alkanes MolecularSelfAssembly organic_polymer Multiferroic_materials ForceVolumeImage SKKU Holes Electronics Inorganic UnivOfMaryland Treatment Sidewall fifber Defect bias_mode Electical&Electronics Conductance Adhesion
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CVD Grown WS2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au A (k=1N/m, f=90kHz)
- Scan Size: 17μm×17μm
- Scan Rate: 0.3Hz
- Pixel Size: 512 × 256
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au A (k=1N/m, f=90kHz)
- Scan Size: 17μm×17μm
- Scan Rate: 0.3Hz
- Pixel Size: 512 × 256