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oxide_layer PpLdpe organic_polymer Insulator Neodymium SmalScan KelvinProbeForceMicroscopy HiVacuum HBN Gallium_Arsenide HumanHair HOPG Semiconductor Glass 3-hexylthiophene SAM Iron LiquidCrystal PinpointNanomechanicalMode BiFeO3 C36H74 temp_control AtomicLayer BlockCopolymer VerticalPFM Polydimethylsiloxane Foil PinPointMode align PS_PVAC Cross-section HexagonalBN Electrode SrTiO3 LMF
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MoS2 (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au(k=1N/m, f=90kHz)
- Scan Size: 30μm×30μm,10μm×10μm
- Scan Rate: 0.1Hz
- Pixel: 512×1024