-
YttriaStabilizedZirconia Pattern SSRM PANI PhthalocyaninePraseodymium DLaTGS FrequencyModulation CrossSection HardDiskMedia Bmp Cross-section CuSubstrate Workfunction Aggregated_molecules Sic Writing MESA structure HexagonalBN Piezo semifluorinated alkane thermoplastic_elastomers Nanotechnology Defect TungstenThinFilmDeposition BaTiO3 CalciumHydroxide Organic ULCA cross section Carbon Fluoride WWafer ConductingPolymer LFM BiVO4
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BTO
Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac