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cooling lithography dielectric_trench Wonseok MembraneFilter Perovskite LiquidImaging InsulatorFilm SmalScan EvatecAG ito_film high_resolution Potential Magnetostrictive gallium_nitride tip_bias_mode pinpoint mode Cell Stiffness LiquidCrystal DeflectionOptics BiVO4 OpticalModulator TPU TungstenDeposition SKPM Temasek_Lab Friction Topography HiVacuum PolyvinylAcetate MolecularSelfAssembly Sidewall MagneticPhase mfm_amplitude
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Block Copolymer Embedded in Rubber
Block copolymer embedded in rubber cross-section.
Scanning Conditions
- System: NX20
- Scan Mode: Pinpoint
- Cantilever: NSC36Cr-Au B (k=2N/m, f=130kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.29Hz
- Pixel Size: 256 × 256
- Scan Mode: Pinpoint
- Cantilever: NSC36Cr-Au B (k=2N/m, f=130kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.29Hz
- Pixel Size: 256 × 256