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SiliconeOxide Photovoltaics MagneticForceMicroscopy VortexCore AM_KPFM Strontium P3HT Mobile layers NUS_NNI_Nanocore Jason PhaseChange FAPbI3 SKPM PinpointNanomechanicalMode CntFilm Morphology NUSNNI Foil Stiffness ConductiveAFM temp_control SmalScan PatternedSapphireSubstrat PolyvinylideneFluoride Polyvinylidene TemperatureControl ElectroChemical norganic LateralPFM PhaseImaging CompactDisk PtfeMembrane Fe_film hetero_structure
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Ecoli, Ecoli treated with Cirpofloaxin
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: ACTA (k=40N/m, f=300kHz)
- Scan Size: 20μm×20μm, 20μm×20μm
- Scan Rate: 0.8Hz, 0.5Hz
- Pixel: 256×256, 256×256