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Cobalt StrontiumTitanate Modulus Composition ThermalConductivity PS_PVAC pinpoint mode Topography LDPE light_emitting silicon_carbide Display DLaTGS Jason Piezo amplitude_modulation Phosphide Iron BloodCell Bismuth NCM\ PetruPoni FailureAnlaysis LateralPFM I-VSpectroscopy Spain Regensburg PyroelectricDetector KAIST DNAProtein Bacteria Chromium Defect Temasek_Lab SmalScan
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V