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ScratchMode Polydimethylsiloxane Silicon PANI PetruPoni_Institute ForceMapping BismuthVanadate Self-assembledMonolayer Chungnam_National_University LiIonBattery YttriaStabilizedZirconia thermal_conductivity DeoxyribonucleicAcid Etch PinpointPFM CaMnO3 EvatecAG EFM nanobar AlkaneFilm C36H74 PyroelectricDetector SRAM GlassTemperature Strontium EFMAmplitude Pvdf Oxidation LiBattery Pzt CopperFoil Hydroxyapatite HDD Yeditepe_University LiftMode
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V