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ThermalConductivity PS_PVAC ElectrostaticForceMicroscopy ContactModeDots BaTiO3 Cross-section FM_KPFM Singapore OpticalModulator PolyimideFilm Growth PS_LDPE PetruPoni UnivMaryland Current Friction Reduction TappingMode University_of_Regensburg FM_SKPM SingleCrystal ScratchMode UnivCollegeLondon Chromium Austenite FM-KPFM kelvin probe force microscopy TipBiasMode HumanHair PDMS ContactModeDot molecular_beam Carbon PECurve Polarization
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MoS₂ film
Scanning Conditions
- System : FX40
- Scan Mode: Tapping
- Scan Rate : 1Hz
- Scan Size : 40μm×40μm
- Pixel Size : 512×256
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)