-
FFM Domain Annealed Conductance PinpointNanomechanicalMode Magnets BaTiO3 Sphere dielectric trench OrganicSemiconductor 3-hexylthiophene Stiffness align Hair Ferroelectric Friction PatternedSapphireSubstrat #EC HiVacuum food small_scan BiVO4 StyreneBeads heterojunctions HACrystal semifluorinated_alkane gallium_nitride CarbonNanotube Formamidinium_lead_iodide plastics non_contact Sulfur MolecularSelfAssembly SelfAssembly CeNSE_IISc
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
ITO glass
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 3μm×3μm, 1μm×1μm
- Scan Rate: 0.4Hz, 1Hz
- Pixel: 512×512, 512×512