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mfm_amplitude Lateral Water ElectroChemical KAIST PiezoelectricForceMicroscopy Dimethicone Varistor AIN semifluorinated_alkanes EFMAmplitude Phase LateralForce Alkane Pvdf Array Mapping PtfeFilter silicon_carbide #EC CP-AFM Multiferroic_materials Annealed membrane Nanofiber KelvinProbeForceMicroscopy ItoGlass Dopped layers TiO2 piezoelectric force microscopy Barium_titanate doped Singapore NUS_Physics
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Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256