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Singapore molecular_self_assembly kelvin probe force microscopy Defects AIN Insulator Microchannel Forevision Tin disulfide lithography Yttria_stabilized_Zirconia polymeric_arrays VortexCore PinpointPFM Foil dielectric trench polyvinyl acetate FM-KPFM Granada ConductingPolymer Thermal Hysteresys AM_SKPM Scanning_Thermal_Microscopy Indium_tin_oxide Stiffness Phosphide ForceVolume HighResolution solar_cell epitaxy University_of_Regensburg TungstenThinFilmDeposition pinpoint mode CVD
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Graphene on SiO2
Scanning Conditions
- System: NX20
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256