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Oxidation PvdfFilm Ram Neodymium MultiferroicMaterials Liquid MfmPhase self-assembly Topography LiftMode Piezo CuFoil DNAProtein Tin disulfide BiasMode Crystal thermal_conductivity StrontiumTitanate conductive self_healing LowDensityPolyethylene amplitude_modulation PtfeFilter Pore Battery Conductive AFM BFO PS_PVAC SiliconeOxide Iron TPU sputter Sphere ContactMode IndiumTinOxide
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Graphene on SiO2
Scanning Conditions
- System: NX20
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256