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University_of_Regensburg Semiconductor Phosphide HOPG YszSubstrate ThinFilm LiBattery Strontium CrossSection Photovoltaics Polymer SoftSample NanoLithography Adhesion BiFeO3 Korea FM_KPFM Tin sulfide pinpoint mode hetero_structure Current Molybdenum Pattern Fluoride BismuthVanadate Polystyrene AmplitudeModulation Foil AdhesionEnergy Tape Lift Hysteresys Fujian LiftHeight SiWafer
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HfO2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: ElectriMulti75 (k=3 N/m, f=75kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 256×256