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LateralForceMicroscopy Solar PhaseImaging BTO epitaxy OxideLayer Graphite Nanostructure LowDensityPolyethylene StyreneBeads AAO LateralPFM thermal_property BismuthVanadate PFM MembraneFilter GlassTemp MonoLayer cooling Holes Mosfet medical Pinpoint chemical_compound plastic Layer Pores LeakageCurrent Sapphire DLaTGS Foil MolybdenumDisulfide NanoLithography BloodCell MultiferroicMaterials
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Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256