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block_copolymer Nanofiber PrCurve Chrome SoftSample Change VortexCore Mfm Chemical_Vapor_Deposition PS_LDPE AlkaneFilm Yeditepe_University Pore Celebration Oxide AEAPDES Tapping Optoelectronic Etch Conducting heterojunctions MBE Deposition Polypropylene Materials CalciumHydroxyapatite SRAM Patterns multi_layer fluorocarbon Alloy Techcomp Spincast Photovoltaics ThinFilm
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Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256