Since atomic force microscopy (AFM) has been developed, it becomes novel technique for surface investigation including topography and other material properties measurement. AFM shows high utilization in the research field due to complementary relationships with optical microscopy, electron microscopy and other measuring equipment.
In this session, the basic principles and the application of AFM which can be used in scientific and industrial fields are examined. In particular, we share the images measured by the actual atomic force microscope with specific examples of various applications and look at their meaning. In addition, we present how to operate AFM including cantilever selection, sample preparation, description of imaging parameters and operation in order to obtain better understanding for AFM. As the first session, AFM cantilever selection depends on sample type is one of the most important processes for the proper result. We review several representative AFM cantilevers and provide tips for how to choose AFM cantilever. Also, how to prepare your sample for AFM imaging, specific meaning of AFM parameters and their outputs are discussed using actual examples and pictures.
After oral session, AFM live demo using standard sample is prepared by Park Systems skillful engineer. During the AFM live demo session, hardware and software setup with Auto and Manual mode are presented for understanding of actual AFM measurement.

Dr. Kim received Ph.D. degree in Materials Science and Engineering from Nanyang Technological University, Singapore. He joined Tokyo Institute of Technology International Research Opportunities Program (TiROP) in 2014 and was engaged in nano-scale chemical composition analysis using scanning probe microscopy (SPM). From December 2017, he started to work in Park Systems as the manager of application technology center. He is specialized in the enhancement of nano-machanical measurement performance for Atomic Force Microscopy (AFM), building up a accurate and reliable environment for electrochemical measurement using Scanning Probe Microscopy (SPM; SECM,SECCM) and Scanning Ion Conductance Microscopy (SICM) applications development for biology.

With ever-decreasing device sizes in the semiconductor industry, the demand for functional materials with low dimensionality continues to grow. Since the discovery of graphene in 2004,¹ 2D materials have caught the interest of scientific and industrial research. Among 2D materials for semiconductor applications, transition metal dichalcogenides (TMDs) are particularly promising. However, TMDs often exhibit morphological features such as grain boundaries, which affect the electronic properties locally.² Hence, characterization of TMDs requires techniques with high spatial resolution and sensitivity for electronic properties, including conductivity and surface potential. Atomic Force Microscopy not only offers topography imaging with local resolutions on the nanoscale, but also resolves electronic properties by scanning the surface with an electrically conductive tip.
In this webinar, we will demonstrate on Park’s NX Hivac how high vacuum (10^-5 Torr) significantly improves the sensitivity and the resolution of electrical AFM modes on TMDs. The removal of the surface water layer leads to an improved electrical contact between tip and sample. At the same time, the vacuum environment prevents the adverse doping effect of the TMD material, which effectively lowers the material’s conductivity. Thereby, the local electronic characterization of TMDs can be pushed to the next level.

1.Novoselov, K. S. et al. Electric Field Effect in Atomically Thin Carbon Films. Science (80-. ). 306, 666 LP – 669 (2004).
2.Ludwig, J. et al. Effects of buried grain boundaries in multilayer MoS2. Nanotechnology 30, 285705 (2019).

Presented By : 
Ilka Hermes - Principle Scientist Park Systems Europe, Mannheim, Germany
ihermes@parksystems.com

Ilka is the principle scientist at Park Systems Europe, where she maintains and supports scientific collaborations to establish new research projects.
Prior, she worked at the Max Planck Institute for Polymer Research (Main Germany) in the group of Stefan Weber to investigate perovskite solar cells with electrical Atomic Force Microscopy (AFM) modes, and at the Johannes Gutenberg University Mainz in the group of Angelika Kühnle to characterize liquid-solid interfaces with high resolution AFM. Ilka’s primary fields of expertise include Piezoresponse Force Microscopy (PFM), Kelvin Probe Force Microscopy (KFM), and conductive AFM on semiconducting and/or ferroelectric devices.

主讲人： 
程志海教授

中国人民大学物理学系教授，博士生导师，基金委优青，中国仪器仪表学会显微仪器分会理事，中国硅酸盐学会微纳米分会理事。2002年毕业于大连理工大学物理与光电工程学院应用物理系。2002-2007年，在中国科学院物理研究所纳米物理与器件实验室硕博连读，获凝聚态物理博士学位。2004年7月至2005年1月，在德国柏林自由大学物理系及实验物理研究所做访问学者，2007年8月-2011年7月，在美国加州大学Riverside分校化学系及纳米科学与工程中心从事博士后研究。2011年8月-2017年月，国家纳米科学中心(中科院纳米标准与检测重点实验室)，任副研究员/研究员。曾获中国科学院“引进杰出技术人才计划”（技术百人计划）和首届“卓越青年科学家”，卢嘉锡青年人才奖获得者，青年创新促进会会员并获首届“学科交叉与创新奖”等。目前，主要工作集中在先进原子力探针显微分析技术及其在低维与表面物理、纳米科技等领域的应用基础研究。